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ISSTA
2009
ACM
15 years 4 months ago
Efficient mutation testing by checking invariant violations
David Schuler, Valentin Dallmeier, Andreas Zeller
ISQED
2007
IEEE
120views Hardware» more  ISQED 2007»
15 years 4 months ago
A Test-Structure to Efficiently Study Threshold-Voltage Variation in Large MOSFET Arrays
Nigel Drego, Anantha Chandrakasan, Duane S. Boning
57
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KBSE
2007
IEEE
15 years 4 months ago
Efficiently monitoring data-flow test coverage
Raúl A. Santelices, Mary Jean Harrold