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VLSID
1995
IEEE
112views VLSI» more  VLSID 1995»
15 years 3 months ago
An efficient automatic test generation system for path delay faults in combinational circuits
Ananta K. Majhi, James Jacob, Lalit M. Patnaik, Vi...
ICALP
2010
Springer
15 years 1 months ago
Space-Efficient Scheduling of Stochastically Generated Tasks
Tomás Brázdil, Javier Esparza, Stefa...