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VLSID
1995
IEEE
112views VLSI» more  VLSID 1995»
15 years 1 months ago
An efficient automatic test generation system for path delay faults in combinational circuits
Ananta K. Majhi, James Jacob, Lalit M. Patnaik, Vi...
ICALP
2010
Springer
14 years 11 months ago
Space-Efficient Scheduling of Stochastically Generated Tasks
Tomás Brázdil, Javier Esparza, Stefa...