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ITC
1991
IEEE
80views Hardware» more  ITC 1991»
15 years 3 months ago
An Intelligent Approach to Automatic Test Equipment
In diagnosing a failed system, a smart technician would choose tests to be performed based on the context of the situation. Currently, test program sets do not fault-. isolate wit...
William R. Simpson, John W. Sheppard
DAC
2010
ACM
15 years 3 months ago
A probabilistic and energy-efficient scheduling approach for online application in real-time systems
This work considers the problem of minimizing the power consumption for real-time scheduling on processors with discrete operating modes. We provide a model for determining the ex...
Thorsten Zitterell, Christoph Scholl
AAAI
2008
15 years 2 months ago
On-line Planning and Scheduling: An Application to Controlling Modular Printers
This paper summarizes recent work reported at ICAPS on applying artificial intelligence techniques to the control of production printing equipment. Like many other real-world appl...
Minh Binh Do, Wheeler Ruml, Rong Zhou
DFT
2006
IEEE
148views VLSI» more  DFT 2006»
15 years 1 months ago
Bilateral Testing of Nano-scale Fault-tolerant Circuits
As the technology enters the nano dimension, the inherent unreliability of nanoelectronics is making fault-tolerant architectures increasingly necessary in building nano systems. ...
Lei Fang, Michael S. Hsiao
DAC
2005
ACM
15 years 1 months ago
Smart diagnostics for configurable processor verification
This paper describes a novel technique called Embedded Test-bench Control (ETC), extensively used in the verification of Tensilica’s latest configurable processor. Conventional ...
Sadik Ezer, Scott Johnson