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» Empirical Methodologies in Software Engineering
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IOLTS
2006
IEEE
101views Hardware» more  IOLTS 2006»
15 years 5 months ago
Delay Fault Localization in Test-Per-Scan BIST Using Built-In Delay Sensor
— Delay failures are becoming a dominant failure mechanism in nanometer technologies. Diagnosis of such failures is important to ensure yield and robustness of the design. Howeve...
Swaroop Ghosh, Swarup Bhunia, Arijit Raychowdhury,...
UIST
2006
ACM
15 years 5 months ago
Multi-layer interaction for digital tables
Interaction on digital tables has been restricted to a single layer on the table's active work-surface. We extend the design space of digital tables to include multiple layer...
Sriram Subramanian, Dzmitry Aliakseyeu, Andr&eacut...
SAC
2005
ACM
15 years 4 months ago
Pollock: automatic generation of virtual web services from web sites
As the usage of Web Services proliferates dramatically, new tools to help quickly generate web services are needed. In this paper, we propose a methodology that helps to automatic...
Yi-Hsuan Lu, Yoojin Hong, Jinesh Varia, Dongwon Le...
SBCCI
2005
ACM
185views VLSI» more  SBCCI 2005»
15 years 4 months ago
Automatic generation of test sets for SBST of microprocessor IP cores
Higher integration densities, smaller feature lengths, and other technology advances, as well as architectural evolution, have made microprocessor cores exceptionally complex. Cur...
Ernesto Sánchez, Matteo Sonza Reorda, Giova...
UIST
2005
ACM
15 years 4 months ago
Zliding: fluid zooming and sliding for high precision parameter manipulation
High precision parameter manipulation tasks typically require adjustment of the scale of manipulation in addition to the parameter itself. This paper introduces the notion of Zoom...
Gonzalo Ramos, Ravin Balakrishnan