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» Enabling RTR for industry
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DATE
2010
IEEE
161views Hardware» more  DATE 2010»
15 years 3 months ago
BISD: Scan-based Built-In self-diagnosis
Abstract—Built-In Self-Test (BIST) is less often applied to random logic than to embedded memories due to the following reasons: Firstly, for a satisfiable fault coverage it may...
Melanie Elm, Hans-Joachim Wunderlich
DATE
2010
IEEE
141views Hardware» more  DATE 2010»
15 years 3 months ago
An embedded platform for privacy-friendly road charging applications
—Systems based on satellite localization are enabling new scenarios for road charging schemes by offering the possibility to charge drivers as a function of their road usage. An ...
Josep Balasch, Ingrid Verbauwhede, Bart Preneel
CA
2002
IEEE
15 years 3 months ago
Representing and Parameterizing Agent Behaviors
The last few years have seen great maturation in understanding how to use computer graphics technology to portray 3D embodied characters or virtual humans. Unlike the off-line, an...
Norman I. Badler, Jan M. Allbeck, Liwei Zhao, Meer...
DATE
2002
IEEE
95views Hardware» more  DATE 2002»
15 years 3 months ago
Window-Based Susceptance Models for Large-Scale RLC Circuit Analyses
Due to the increasing operating frequencies and the manner in which the corresponding integrated circuits and systems must be designed, the extraction, modeling and simulation of ...
Hui Zheng, Lawrence T. Pileggi, Michael W. Beattie...
ECBS
2002
IEEE
118views Hardware» more  ECBS 2002»
15 years 3 months ago
On the Relation between Design Contracts and Errors: A Software Development Strategy
When designing a software module or system, a systems engineer must consider and differentiate between how the system responds to external and internal errors. External errors can...
Eivind J. Nordby, Martin Blom, Anna Brunstrom