1943 search results - page 30 / 389 » End-to-End Integration Testing |
240
Voted
ATS
2010
IEEE
14 years 10 months ago
2010
IEEE
In the conventional ADC production test method, a high-quality analogue sine wave is applied to the Analogue-toDigital Converter (ADC), which is expensive to generate. Nowadays, an...
DATE
2007
IEEE
15 years 6 months ago
2007
IEEE
Abstract— We present an SoC testing approach that integrates test data compression, TAM/test wrapper design, and test scheduling. An improved LFSR reseeding technique is used as ...
103
click to vote
ET
2002
15 years 8 days ago
2002
Test access mechanisms (TAMs) and test wrappers are integral parts of a system-on-chip (SOC) test architecture. Prior research has concentrated on only one aspect of the TAM/wrappe...
ITC
2003
IEEE
15 years 5 months ago
2003
IEEE
Prior to the mid 1980s, the dominance of through-hole packaging of integrated circuits (ICs) provided easy access to nearly every pin of every chip on a printed circuit board. Pro...
150
Voted
Publication
For quantitative analysis of histopathological images,
such as the lymphoma grading systems, quantification of
features is usually carried out on single cells before categorizing...