1943 search results - page 31 / 389 » End-to-End Integration Testing |
96
Voted
OOPSLA
2007
Springer
15 years 6 months ago
2007
Springer
This article describes the design and use of the CUTE C++ testing framework and its integration into the Eclipse C++ Development Tooling. Unit testing supports code quality and is...
GLVLSI
2003
IEEE
15 years 5 months ago
2003
IEEE
The current trends in high performance integrated circuits are towards faster and more powerful circuits in the giga-hertz range and even further. As the more complex Integrated C...
DFT
2006
IEEE
15 years 6 months ago
2006
IEEE
1 High temperature has become a major problem for system-on-chip testing. In order to reduce the test time while keeping the temperature of the chip under test within a safe range,...
97
Voted
DAC
2008
ACM
16 years 1 months ago
2008
ACM
In modular testing of system-on-a-chip (SoC), test access mechanisms (TAMs) are used to transport test data between the input/output pins of the SoC and the cores under test. Prio...
115
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COMPSAC
2009
IEEE
15 years 5 months ago
2009
IEEE
—In continuous integration, a tight integration of test case prioritization techniques and fault-localization techniques may both expose failures faster and locate faults more ef...