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DSD
2007
IEEE
98views Hardware» more  DSD 2007»
15 years 6 months ago
Fault Diagnosis in Integrated Circuits with BIST
This paper presents an optimized fault diagnosing procedure applicable in Built-in Self-Test environments. Instead of the known approach based on a simple bisection of patterns in...
Raimund Ubar, Sergei Kostin, Jaan Raik, Teet Evart...
TIFS
2008
120views more  TIFS 2008»
15 years 12 days ago
Determining Image Origin and Integrity Using Sensor Noise
In this paper, we provide a unified framework for identifying the source digital camera from its images and for revealing digitally altered images using photo-response nonuniformit...
Mo Chen, Jessica J. Fridrich, Miroslav Goljan, Jan...
117
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FORTE
1997
15 years 1 months ago
A Framework for Distributed Object-Oriented Testing
Distributed programming and object-oriented programming are two popular programming paradigms. The former is driven by advances in networking technology whereas the latter provide...
Alan C. Y. Wong, Samuel T. Chanson, Shing-Chi Cheu...
DATE
2000
IEEE
87views Hardware» more  DATE 2000»
15 years 4 months ago
Test Synthesis for Mixed-Signal SOC Paths
Higher levels of integration, the need for test re-use, and the mixed-signal nature of today’s SOC’s necessitate hierarchical test generation and system level test composition...
Sule Ozev, Ismet Bayraktaroglu, Alex Orailoglu
94
Voted
ESCIENCE
2007
IEEE
15 years 6 months ago
An Integrated Grid Development Environment in Eclipse
With the proliferation of Grid computing, a large number of computational resources are available for solving complex scientific and engineering problems. Nevertheless, it is non-...
Donny Kurniawan, David Abramson