1943 search results - page 38 / 389 » End-to-End Integration Testing |
VTS
2006
IEEE
15 years 6 months ago
2006
IEEE
This paper presents the design and experimental results of fully integrated CMOS power sensors for RF built-in self-test (BIST) applications. Using a standard 0.18- m CMOS process...
123
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EVOW
2001
Springer
15 years 5 months ago
2001
Springer
The integrated circuits design flow is rapidly moving towards higher description levels. However, test-related activities are lacking behind this trend, mainly since effective faul...
85
Voted
DATE
1997
IEEE
15 years 4 months ago
1997
IEEE
The paper proposes a novel approach in an attempt to solve the test problem for sequential circuits. Up until now, most of the classical test pattern techniques use a number of al...
120
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COMPSAC
2001
IEEE
15 years 4 months ago
2001
IEEE
Regression testing has been a popular quality assurance technique. Most regression testing techniques are based on code or software design. This paper proposes a scenario-based fu...
99
Voted
DAGSTUHL
2004
15 years 1 months ago
2004
Testing often accounts for more than 50% of the required effort during system development. However, testing is often not well integrated with other development phases. One reason ...