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CODES
2008
IEEE
16 years 22 days ago
Don't forget memories: a case study redesigning a pattern counting ASIC circuit for FPGAs
Modern embedded compute platforms increasingly contain both microprocessors and field-programmable gate arrays (FPGAs). The FPGAs may implement accelerators or other circuits to s...
David Sheldon, Frank Vahid
CODES
2007
IEEE
16 years 18 days ago
Channel trees: reducing latency by sharing time slots in time-multiplexed networks on chip
Networks on Chip (NoC) have emerged as the design paradigm for scalable System on Chip communication infrastructure. A growing number of applications, often with firm (FRT) or so...
Andreas Hansson, Martijn Coenen, Kees Goossens
IOLTS
2007
IEEE
155views Hardware» more  IOLTS 2007»
16 years 17 days ago
On Derating Soft Error Probability Based on Strength Filtering
— Soft errors caused by ionizing radiation have emerged as a major concern for current generation of CMOS technologies and the trend is expected to get worse. A significant frac...
Alodeep Sanyal, Sandip Kundu
IOLTS
2007
IEEE
120views Hardware» more  IOLTS 2007»
16 years 17 days ago
Accelerating Soft Error Rate Testing Through Pattern Selection
Soft error due to ionizing radiation is emerging as a major concern for future technologies. The measurement unit for failures due to soft errors is called Failure-In-Time (FIT) t...
Alodeep Sanyal, Kunal P. Ganeshpure, Sandip Kundu
IPPS
2007
IEEE
16 years 17 days ago
Virtual Execution Environments: Support and Tools
In today’s dynamic computing environments, the available resources and even underlying computation engine can change during the execution of a program. Additionally, current tre...
Apala Guha, Jason Hiser, Naveen Kumar, Jing Yang, ...