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204
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TASLP
2011
14 years 12 months ago
2011
Abstract—The shifted delta cepstrum (SDC) is a widely used feature extraction for language recognition (LRE). With a high context width due to incorporation of multiple frames, S...
161
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TC
2011
14 years 12 months ago
2011
—CMOS scaling has long been a source of dramatic performance gains. However, semiconductor feature size reduction has resulted in increasing levels of operating temperatures and ...
204
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TC
2011
14 years 12 months ago
2011
—Aggressive technology scaling to 45nm and below introduces serious reliability challenges to the design of microprocessors. Since a large fraction of chip area is devoted to on-...
156
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TC
2011
14 years 12 months ago
2011
—During any composite computation, there is a constant need for rounding intermediate results before they can participate in further processing. Recently, a class of number repre...
177
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TCAD
2011
14 years 12 months ago
2011
—Pre-bond testing of 3-D stacked integrated circuits (ICs) involves testing each individual die before bonding. The overall yield of 3-D ICs improves with pre-bond testability be...