469 search results - page 15 / 94 » Evolutionary Approach to Test Generation for Functional BIST |
GECCO
2004
Springer
15 years 5 months ago
2004
Springer
Abstract. This work introduces a new evolutionary algorithm that adapts the operator probabilities (rates) while evolves the solution of the problem. Each individual encodes its ge...
84
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GECCO
2004
Springer
15 years 5 months ago
2004
Springer
Fitness functions derived for certain white-box test goals can cause problems for Evolutionary Testing (ET), due to a lack of sufficient guidance to the required test data. Often t...
107
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ICANNGA
2007
Springer
15 years 4 months ago
2007
Springer
Abstract. In the paper, a new method of decision tree learning for costsensitive classification is presented. In contrast to the traditional greedy top-down inducer in the proposed...
ISCAS
2005
IEEE
15 years 6 months ago
2005
IEEE
—We present a Built-In Self-Test (BIST) approach based on direct digital synthesizer (DDS) for functionality testing of analog circuitry in mixed-signal systems. DDS with Delta-S...
133
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DATE
2010
IEEE
15 years 5 months ago
2010
IEEE
Abstract—Built-In Self-Test (BIST) is less often applied to random logic than to embedded memories due to the following reasons: Firstly, for a satisfiable fault coverage it may...