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» Evolutionary Approach to Test Generation for Functional BIST
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114
Voted
KES
2006
Springer
15 years 14 days ago
Evolutionary Tuning of Combined Multiple Models
Abstract. In data mining, hybrid intelligent systems present a synergistic combination of multiple approaches to develop the next generation of intelligent systems. Our paper prese...
Gregor Stiglic, Peter Kokol
GECCO
2004
Springer
244views Optimization» more  GECCO 2004»
15 years 6 months ago
Using Clustering Techniques to Improve the Performance of a Multi-objective Particle Swarm Optimizer
In this paper, we present an extension of the heuristic called “particle swarm optimization” (PSO) that is able to deal with multiobjective optimization problems. Our approach ...
Gregorio Toscano Pulido, Carlos A. Coello Coello
130
Voted
ITC
1993
IEEE
148views Hardware» more  ITC 1993»
15 years 4 months ago
DELTEST: Deterministic Test Generation for Gate-Delay Faults
This paper presents an efficient approach to generate tests for gate delay faults. Unlike other known algorithms which try to generate a 'good' delay test the presented ...
Udo Mahlstedt
100
Voted
VLSID
2009
IEEE
115views VLSI» more  VLSID 2009»
16 years 1 months ago
Efficient Techniques for Directed Test Generation Using Incremental Satisfiability
Functional validation is a major bottleneck in the current SOC design methodology. While specification-based validation techniques have proposed several promising ideas, the time ...
Prabhat Mishra, Mingsong Chen
96
Voted
DAC
2009
ACM
16 years 1 months ago
Generating test programs to cover pipeline interactions
Functional validation of a processor design through execution of a suite of test programs is common industrial practice. In this paper, we develop a high-level architectural speci...
Thanh Nga Dang, Abhik Roychoudhury, Tulika Mitra, ...