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159
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ISSRE
2006
IEEE
15 years 9 months ago
Call Stack Coverage for GUI Test-Suite Reduction
—Graphical user interfaces (GUIs) are used as front ends to most of today’s software applications. The event-driven nature of GUIs presents new challenges for testing. One impo...
Scott McMaster, Atif M. Memon
129
Voted
VTS
1996
IEEE
112views Hardware» more  VTS 1996»
15 years 8 months ago
Optimal voltage testing for physically-based faults
In this paper we investigate optimal voltage testing approaches for physically-based faults in CMOS circuits. We describe the general nature of the problem and then focus on two f...
Yuyun Liao, D. M. H. Walker
DATE
2004
IEEE
138views Hardware» more  DATE 2004»
15 years 7 months ago
STEPS: Experimenting a New Software-Based Strategy for Testing SoCs Containing P1500-Compliant IP Cores
This paper presents STEPS, an innovative softwarebased approach for testing P1500-compliant SoCs. STEPS is based on the concept that the ATE is not considered as an initiator appl...
Mounir Benabdenbi, Alain Greiner, François ...
150
Voted
DFT
2006
IEEE
148views VLSI» more  DFT 2006»
15 years 5 months ago
Bilateral Testing of Nano-scale Fault-tolerant Circuits
As the technology enters the nano dimension, the inherent unreliability of nanoelectronics is making fault-tolerant architectures increasingly necessary in building nano systems. ...
Lei Fang, Michael S. Hsiao
140
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TEC
2012
195views Formal Methods» more  TEC 2012»
13 years 6 months ago
The Effects of Constant and Bit-Wise Neutrality on Problem Hardness, Fitness Distance Correlation and Phenotypic Mutation Rates
Kimura’s neutral theory of evolution has inspired researchers from the evolutionary computation community to incorporate neutrality into Evolutionary Algorithms (EAs) in the hop...
Riccardo Poli, Edgar Galván López