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ERSHOV
2003
Springer
15 years 5 months ago
Integration of Functional and Timed Testing of Real-Time and Concurrent Systems
The article presents an approach to model based testing of complex systems based on a generalization of finite state machines (FSM) and input output state machines (IOSM). The app...
Victor V. Kuliamin, Alexandre Petrenko, Nick V. Pa...
ET
2002
122views more  ET 2002»
14 years 11 months ago
Using At-Speed BIST to Test LVDS Serializer/Deserializer Function
LVDS is the acronym for Low-Voltage-DifferentialSignaling and is described in both the ANSI/TIA/EIA644 and IEEE 1596.3 standards. High performance yet Low Power and EMI have made ...
Magnus Eckersand, Fredrik Franzon, Ken Filliter
SODA
2010
ACM
175views Algorithms» more  SODA 2010»
15 years 9 months ago
Lower Bounds for Testing Triangle-freeness in Boolean Functions
Let f1, f2, f3 : Fn 2 {0, 1} be three Boolean functions. We say a triple (x, y, x + y) is a triangle in
Arnab Bhattacharyya, Ning Xie
BMCBI
2006
146views more  BMCBI 2006»
14 years 12 months ago
GeneTools - application for functional annotation and statistical hypothesis testing
Background: Modern biology has shifted from "one gene" approaches to methods for genomic-scale analysis like microarray technology, which allow simultaneous measurement ...
Vidar Beisvag, Frode K. R. Jünge, Hallgeir Be...
VTS
2008
IEEE
70views Hardware» more  VTS 2008»
15 years 6 months ago
A Statistical Approach to Characterizing and Testing Functionalized Nanowires
Unlike the top-down photolithographic CMOS VLSI process, cost-effective bulk fabrication of nanodevices calls for a bottom-up approach, generally called self-assembly. Selfassembl...
James Dardig, Haralampos-G. D. Stratigopoulos, Eri...