3639 search results - page 158 / 728 » Experiments on IPv6 Testing |
149
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DATE
2010
IEEE
15 years 8 months ago
2010
IEEE
Abstract—Built-In Self-Test (BIST) is less often applied to random logic than to embedded memories due to the following reasons: Firstly, for a satisfiable fault coverage it may...
117
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ICCAD
2000
IEEE
15 years 7 months ago
2000
IEEE
computation and automatic abstraction. Second, Ketchum performs not only automatic test generation but also unreachability analysis, which enables the test generation effort to be ...
121
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SDM
2008
SIAM
15 years 4 months ago
2008
SIAM
Covariate shift is a situation in supervised learning where training and test inputs follow different distributions even though the functional relation remains unchanged. A common...
109
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CAINE
2004
15 years 4 months ago
2004
- Automated tools for error prevention and error detection exist for many high-level languages, but have been nonexistent for assembly-language programs, embedded programs in parti...
125
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BMCBI
2004
15 years 2 months ago
2004
Background: To identify differentially expressed genes across experimental conditions in oligonucleotide microarray experiments, existing statistical methods commonly use a summar...