1253 search results - page 38 / 251 » Exploration Testing |
CEC
2005
IEEE
15 years 5 months ago
2005
IEEE
Testing of VLSI circuits can cause generation of excessive heat which can damage the chips under test. In the random testing environment, high-performance CMOS circuits consume sig...
ECCV
2006
Springer
16 years 1 months ago
2006
Springer
Abstract. The estimation of the epipolar geometry is especially difficult where the putative correspondences include a low percentage of inlier correspondences and/or a large subse...
101
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VRCAI
2004
ACM
15 years 5 months ago
2004
ACM
Despite steady research advances in many aspects of virtual reality, building and testing virtual worlds remains to be a very difficult process. Most virtual environments are stil...
119
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ICVS
2001
Springer
15 years 4 months ago
2001
Springer
In this paper a system will be presented that was developed for ESA for the support of planetary exploration. The system that is sent to the planetary surface consists of a rover a...
IJFCS
2006
14 years 11 months ago
2006
This paper studies conflicts from a process-algebraic point of view and shows how they are related to the testing theory of fair testing. Conflicts have been introduced in the con...