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124
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CEC
2005
IEEE
15 years 10 months ago
2005
IEEE
Testing of VLSI circuits can cause generation of excessive heat which can damage the chips under test. In the random testing environment, high-performance CMOS circuits consume sig...
120
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ICALT
2005
IEEE
15 years 10 months ago
2005
IEEE
This paper reports MALESAbrain an intelligent online tool for problem-based learning (PBL) in IT education. The learning model of MALESAbrain is built on the notions of threshold ...
143
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ICRA
2005
IEEE
15 years 10 months ago
2005
IEEE
— We explore the control synthesis problem for a robot dynamically manipulating an object in the presence of multiple frictional contacts. Contacts occur both between the object ...
139
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INFOVIS
2005
IEEE
15 years 10 months ago
2005
IEEE
The NameVoyager, a web-based visualization of historical trends in baby naming, has proven remarkably popular. This paper discusses the display techniques used for smooth visual e...
130
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IPPS
2005
IEEE
15 years 10 months ago
2005
IEEE
— In distributed heterogeneous Grid environments the protocols used to exchange bits are crucial. As researchers work hard to discover the best new protocol for the Grid, applica...