42 search results - page 7 / 9 » Fault Detection Capabilities of Coupling-based OO Testing |
ET
2002
14 years 9 months ago
2002
LVDS is the acronym for Low-Voltage-DifferentialSignaling and is described in both the ANSI/TIA/EIA644 and IEEE 1596.3 standards. High performance yet Low Power and EMI have made ...
67
Voted
ATS
1996
IEEE
15 years 1 months ago
1996
IEEE
In this paper, we present a novel and efticient approach to test MCM at the module as well as chip levels. Our design incorporates the concept of the multifrequency test method an...
73
Voted
TFS
2008
14 years 9 months ago
2008
A reliable monitoring system is critically needed in a wide range of industries to detect the occurrence of a fault to prevent machinery performance degradation, malfunction, and s...
DATE
2000
IEEE
15 years 1 months ago
2000
IEEE
∗∗ Functional BIST is a promising solution for self-testing complex digital systems at reduced costs in terms of area and performance degradation. The present paper addresses t...
IEEEPACT
2008
IEEE
15 years 3 months ago
2008
IEEE
Technology scaling in integrated circuits has consistently provided dramatic performance improvements in modern microprocessors. However, increasing device counts and decreasing o...