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ATS
2009
IEEE
127views Hardware» more  ATS 2009»
15 years 2 months ago
On the Generation of Functional Test Programs for the Cache Replacement Logic
Caches are crucial components in modern processors (both stand-alone or integrated into SoCs) and their test is a challenging task, especially when addressing complex and high-fre...
Wilson J. Perez, Danilo Ravotto, Edgar E. Sá...
DATE
2000
IEEE
130views Hardware» more  DATE 2000»
15 years 2 months ago
Optimal Hardware Pattern Generation for Functional BIST
∗∗ Functional BIST is a promising solution for self-testing complex digital systems at reduced costs in terms of area and performance degradation. The present paper addresses t...
Silvia Cataldo, Silvia Chiusano, Paolo Prinetto, H...
TC
1998
14 years 9 months ago
Abstraction Techniques for Validation Coverage Analysis and Test Generation
ion Techniques for Validation Coverage Analysis and Test Generation Dinos Moundanos, Jacob A. Abraham, Fellow, IEEE, and Yatin V. Hoskote —The enormous state spaces which must be...
Dinos Moundanos, Jacob A. Abraham, Yatin Vasant Ho...
89
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EMSOFT
2006
Springer
15 years 1 months ago
Analysis of the zeroconf protocol using UPPAAL
We report on a case study in which the model checker Uppaal is used to formally model parts of Zeroconf, a protocol for dynamic configuration of IPv4 link-local addresses that has...
Biniam Gebremichael, Frits W. Vaandrager, Miaomiao...
DAC
2009
ACM
15 years 10 months ago
Generating test programs to cover pipeline interactions
Functional validation of a processor design through execution of a suite of test programs is common industrial practice. In this paper, we develop a high-level architectural speci...
Thanh Nga Dang, Abhik Roychoudhury, Tulika Mitra, ...