613 search results - page 112 / 123 » Fault Tolerant Data Structures |
DAC
2007
ACM
15 years 10 months ago
2007
ACM
Negative bias temperature instability (NBTI) in MOSFETs is one of the major reliability challenges in nano-scale technology. This paper presents an efficient technique to characte...
PDP
2010
IEEE
15 years 4 months ago
2010
IEEE
AbstractāAs computing capabilities have increased, the coupling of computational models has become an increasingly viable and therefore important way of improving the physical ļ¬...
ISCA
2009
IEEE
15 years 4 months ago
2009
IEEE
Shared-memory multi-threaded programming is inherently more diļ¬cult than single-threaded programming. The main source of complexity is that, the threads of an application can in...
ASPLOS
2006
ACM
15 years 3 months ago
2006
ACM
Concurrency bugs are among the most difļ¬cult to test and diagnose of all software bugs. The multicore technology trend worsens this problem. Most previous concurrency bug detect...
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PPOPP
2006
ACM
15 years 3 months ago
2006
ACM
Recently there has been renewed interest in building reliable servers that support continuous application operation. Besides maintaining system state consistent after a failure, o...