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163
Voted
ISCA
2012
IEEE
13 years 4 months ago
2012
IEEE
The reliability of future processors is threatened by decreasing transistor robustness. Current architectures focus on delivering high performance at low cost; lifetime device rel...
109
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MICRO
2008
IEEE
15 years 8 months ago
2008
IEEE
Scaling of CMOS feature size has long been a source of dramatic performance gains. However, the reduction in voltage levels has not been able to match this rate of scaling, leadin...
CASES
2006
ACM
15 years 7 months ago
2006
ACM
With advances in process technology, soft errors (SE) are becoming an increasingly critical design concern. Due to their large area and high density, caches are worst hit by soft ...
119
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ISLPED
2004
ACM
15 years 7 months ago
2004
ACM
Microprocessor designers use techniques such as clock gating to reduce power dissipation. An unfortunate side-effect of these techniques is the processor current fluctuations th...
125
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TC
2011
14 years 8 months ago
2011
—CMOS scaling has long been a source of dramatic performance gains. However, semiconductor feature size reduction has resulted in increasing levels of operating temperatures and ...