936 search results - page 115 / 188 » Fault tolerant mechanism design |
133
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IEEEPACT
2008
IEEE
15 years 8 months ago
2008
IEEE
Technology scaling in integrated circuits has consistently provided dramatic performance improvements in modern microprocessors. However, increasing device counts and decreasing o...
115
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ICCD
2008
IEEE
15 years 10 months ago
2008
IEEE
— Extreme scaling practices in silicon technology are quickly leading to integrated circuit components with limited reliability, where phenomena such as early-transistor failures...
104
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INFOCOM
2003
IEEE
15 years 7 months ago
2003
IEEE
— We analyze the susceptibility of the Internet to random faults, malicious attacks, and mixtures of faults and attacks. We analyze actual Internet data, as well as simulated dat...
126
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BIOCOMP
2006
15 years 3 months ago
2006
A total of 4,131 expressed sequence tags (ESTs) were selected from wheat EST database (http://wheat.pw.usda.gov/cgi-bin/westsql/est_lib.cgi.) to identify genic regions differing a...
110
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DFT
2008
IEEE
15 years 8 months ago
2008
IEEE
It is widely recognized that device and interconnect fabrics at the nanoscale will be characterized by an increased susceptibility to transient faults. This appears to be intrinsi...