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ISCA
2005
IEEE
15 years 5 months ago
2005
IEEE
Scaling feature size improves processor performance but increases each device’s susceptibility to defects (i.e., hard errors). As a result, fabrication technology must improve s...
COMPSAC
2005
IEEE
15 years 5 months ago
2005
IEEE
This paper demonstrates our Web Service based NVersion model, WS-FTM (Web Service-Fault Tolerance Mechanism), which applies this well proven technique to the domain of Web Service...
DATE
2007
IEEE
15 years 6 months ago
2007
IEEE
Lasers can be used by hackers to situations to inject faults in circuits and induce security flaws. On-line detection mechanisms are classically proposed to counter such attacks, ...
IOLTS
2006
IEEE
15 years 6 months ago
2006
IEEE
— Delay failures are becoming a dominant failure mechanism in nanometer technologies. Diagnosis of such failures is important to ensure yield and robustness of the design. Howeve...
DATE
2008
IEEE
15 years 6 months ago
2008
IEEE
We expect that in future commodity hardware will be used in safety critical applications. But the used commodity microprocessors will become less reliable because of decreasing fe...