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VLSID
2000
IEEE
102views VLSI» more  VLSID 2000»
15 years 6 months ago
Inductance Characterization of Small Interconnects Using Test-Signal Method
The test signal method can be used to measure and model inductance parameters (self and mutual) of a very small interconnect especially in highdensity IC’s by using a test signa...
Jeegar Tilak Shah, Madhav P. Desai, Sugata Sanyal
AIR
2005
99views more  AIR 2005»
15 years 1 months ago
Evolving General Term-Weighting Schemes for Information Retrieval: Tests on Larger Collections
Term-weighting schemes are vital to the performance of Information Retrieval models that use term frequency characteristics to determine the relevance of a document. The vector spa...
Ronan Cummins, Colm O'Riordan
METRICS
2003
IEEE
15 years 7 months ago
When Can We Test Less?
When it is impractical to rigorously assess all parts of complex systems, test engineers use defect detectors to focus their limited resources. In this article, we define some pr...
Tim Menzies, Justin S. Di Stefano, Kareem Ammar, K...
IMCSIT
2010
14 years 8 months ago
Development of a Voice Control Interface for Navigating Robots and Evaluation in Outdoor Environments
In this paper the development of a prototypic mobile voice control for navigating autonomous robots within a multi robot system is described. As basis for the voice control a hidde...
Ravi Coote
DAC
1996
ACM
15 years 6 months ago
Efficient Partial Enumeration for Timing Analysis of Asynchronous Systems
-- This paper presents an efficient method for the timing verification of concurrent systems, modeled as labeled Timed Petri nets. The verification problems we consider require us ...
Eric Verlind, Gjalt G. de Jong, Bill Lin