192 search results - page 7 / 39 » Functional Scan Chain Testing |
ICCD
2006
IEEE
15 years 6 months ago
2006
IEEE
This paper discusses an automated method to build scan chains at the register-transfer level (RTL) for powerconstrained at-speed testing. By analyzing a circuit at the RTL, where ...
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ICCAD
1993
IEEE
15 years 1 months ago
1993
IEEE
ICCAD
1992
IEEE
15 years 1 months ago
1992
IEEE
ATS
2001
IEEE
15 years 1 months ago
2001
IEEE
TODAES
2008
14 years 9 months ago
2008
