Search Sciweavers | Sciweavers

192 search results - page 7 / 39

» Functional Scan Chain Testing

121

click to vote

ICCD
2006
IEEE

116views Hardware» more ICCD 2006»

RTL Scan Design for Skewed-Load At-speed Test under Power Constraints

16 years 1 months ago

Download iccd.et.tudelft.nl

This paper discusses an automated method to build scan chains at the register-transfer level (RTL) for powerconstrained at-speed testing. By analyzing a circuit at the RTL, where ...

Ho Fai Ko, Nicola Nicolici

claim paper

Read More »

118

click to vote

ICCAD
1993
IEEE

77views Hardware» more ICCAD 1993»

Reconfigurable scan chains: a novel approach to reduce test application time

15 years 8 months ago

Download poisson.usc.edu

Sridhar Narayanan, Melvin A. Breuer

claim paper

Read More »

100

click to vote

ICCAD
1992
IEEE

96views Hardware» more ICCAD 1992»

Configuring multiple scan chains for minimum test time

15 years 8 months ago

Download poisson.usc.edu

Sridhar Narayanan, Rajesh Gupta, Melvin A. Breuer

claim paper

Read More »

103

click to vote

ATS
2001
IEEE

70views Hardware» more ATS 2001»

Test Scheduling and Scan-Chain Division under Power Constraint

15 years 8 months ago

Download www.ida.liu.se

Erik Larsson, Zebo Peng

claim paper

Read More »

click to vote

TODAES
2008

42views more TODAES 2008»

Layout-aware scan chain reorder for launch-off-shift transition test coverage

15 years 4 months ago

Sciweavers

Explore & Download

Productivity Tools

Sciweavers