142 search results - page 25 / 29 » Functional test generation for non-scan sequential circuits |
ISCAS
2002
IEEE
15 years 2 months ago
2002
IEEE
We present a CMOS circuit that utilizes the back-gate effect to extend the linear range of a subthreshold MOS transconductor. Previous designs of wide-linear-range transconductors...
CAI
2004
Springer
14 years 9 months ago
2004
Springer
A complete hardware implementation of an evolvable combinational unit for FPGAs is presented. The proposed combinational unit consisting of a virtual reconfigurable circuit and evo...
DFT
2008
IEEE
15 years 4 months ago
2008
IEEE
Integrated circuits (IC) targeting at the streaming applications for tomorrow are becoming a fast growing market. Applications such as beamforming require mass computing capabilit...
HICSS
2000
IEEE
15 years 2 months ago
2000
IEEE
With the recent trend towards deregulating power systems around the world, transfer capability computation emerges as the key issue to a smoothly running power market with multipl...
ISPD
2004
ACM
15 years 3 months ago
2004
ACM
As the CMOS technology is scaled into the dimension of nanometer, the clock frequencies and die sizes of ICs are shown to be increasing steadily [5]. Today, global wires that requ...