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DAC
2008
ACM
16 years 4 months ago
Scan chain clustering for test power reduction
An effective technique to save power during scan based test is to switch off unused scan chains. The results obtained with this method strongly depend on the mapping of scan flip-...
Christian G. Zoellin, Hans-Joachim Wunderlich, Jen...
DAC
2007
ACM
16 years 4 months ago
TROY: Track Router with Yield-driven Wire Planning
In this paper, we propose TROY, the first track router with yield-driven wire planning to optimize yield loss due to random defects. As the probability of failure (POF) computed f...
Minsik Cho, Hua Xiang, Ruchir Puri, David Z. Pan
121
Voted
DAC
2003
ACM
16 years 4 months ago
Coverage directed test generation for functional verification using bayesian networks
Functional verification is widely acknowledged as the bottleneck in the hardware design cycle. This paper addresses one of the main challenges of simulation based verification (or...
Shai Fine, Avi Ziv
DAC
2004
ACM
16 years 4 months ago
Architecture-level synthesis for automatic interconnect pipelining
For multi-gigahertz synchronous designs in nanometer technologies, multiple clock cycles are needed to cross the global interconnects, thus making it necessary to have pipelined g...
Jason Cong, Yiping Fan, Zhiru Zhang
DAC
2004
ACM
16 years 4 months ago
A method for correcting the functionality of a wire-pipelined circuit
As across-chip interconnect delays can exceed a clock cycle, wire pipelining becomes essential in high performance designs. Although it allows higher clock frequencies, it may cha...
Vidyasagar Nookala, Sachin S. Sapatnekar