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ICCAD
2006
IEEE
141views Hardware» more  ICCAD 2006»
16 years 4 months ago
Algorithms for MIS vector generation and pruning
Ignoring the effect of simultaneous switching for logic gates causes silicon failures for high performance microprocessor designs. The main reason to omit this effect is the run...
Kenneth S. Stevens, Florentin Dartu
ICCAD
2005
IEEE
94views Hardware» more  ICCAD 2005»
16 years 4 months ago
Post-placement voltage island generation under performance requirement
High power consumption not only leads to short battery life for handheld devices, but also causes on-chip thermal and reliability problems in general. As power consumption is prop...
Huaizhi Wu, I-Min Liu, Martin D. F. Wong, Yusu Wan...
129
Voted
ICCAD
2004
IEEE
99views Hardware» more  ICCAD 2004»
16 years 4 months ago
SPIN-TEST: automatic test pattern generation for speed-independent circuits
Feng Shi, Yiorgos Makris
161
Voted
ICCAD
2003
IEEE
122views Hardware» more  ICCAD 2003»
16 years 4 months ago
Efficient Generation of Monitor Circuits for GSTE Assertion Graphs
Alan J. Hu, Jeremy Casas, Jin Yang