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» Generating Test Data for Functions with Pointer Inputs
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ASPDAC
2007
ACM
108views Hardware» more  ASPDAC 2007»
15 years 1 months ago
Warning: Launch off Shift Tests for Delay Faults May Contribute to Test Escapes
- Two methods to apply tests to detect delay faults in standard scan designs are used. One is called launch off capture and the other is called launch off shift. Launch off shift t...
Zhuo Zhang, Sudhakar M. Reddy, Irith Pomeranz
VLDB
1998
ACM
110views Database» more  VLDB 1998»
15 years 1 months ago
Massive Stochastic Testing of SQL
Deterministic testing of SQL database systems is human intensive and cannot adequately cover the SQL input domain. A system (RAGS), was built to stochastically generate valid SQL ...
Donald R. Slutz
FASE
2006
Springer
15 years 1 months ago
Automated Systematic Testing of Open Distributed Programs
We present an algorithm for automatic testing of distributed programs, such as Unix processes with inter-process communication and Web services. Specifically, we assume that a prog...
Koushik Sen, Gul Agha
NC
1998
140views Neural Networks» more  NC 1998»
14 years 11 months ago
Recurrent Neural Networks with Iterated Function Systems Dynamics
We suggest a recurrent neural network (RNN) model with a recurrent part corresponding to iterative function systems (IFS) introduced by Barnsley 1] as a fractal image compression ...
Peter Tiño, Georg Dorffner
DATE
2000
IEEE
134views Hardware» more  DATE 2000»
15 years 1 months ago
An on Chip ADC Test Structure
In this paper, a new built-in self-test structure to test the static specifications of analog to digital converters (ADCs) is presented. A ramp signal generated by an integrator ...
Yun-Che Wen, Kuen-Jong Lee