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    ATS
    2000
    IEEE
    86views Hardware» more  ATS 2000»
    An adjacency-based test pattern generator for low power BIST design
    15 years 5 months ago
    An adjacency-based test pattern generator for low power BIST design
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    Patrick Girard, Loïs Guiller, Christian Landr...
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    100
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    APSEC
    1999
    IEEE
    105views Software Engineering» more  APSEC 1999»
    A Source Code Generation Support System Using Design Pattern Documents Based on SGML
    15 years 5 months ago
    A Source Code Generation Support System Using Design Pattern Documents Based on SGML
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    Mika Ohtsuki, Akifumi Makinouchi, Norihiko Yoshida
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    ICCAD
    1995
    IEEE
    76views Hardware» more  ICCAD 1995»
    Design verification via simulation and automatic test pattern generation
    15 years 4 months ago
    Design verification via simulation and automatic test pattern generation
    Download  www.ece.ucdavis.edu
    Hussain Al-Asaad, John P. Hayes
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    94
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    TCAD
    2002
    79views more  TCAD 2002»
    An automorphic approach to verification pattern generation for SoC design verification using port-order fault model
    15 years 23 days ago
    An automorphic approach to verification pattern generation for SoC design verification using port-order fault model
    Download  nthucad.cs.nthu.edu.tw
    Chun-Yao Wang, Shing-Wu Tung, Jing-Yang Jou
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    83
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    DAC
    1999
    ACM
    129views Computer Architecture» more  DAC 1999»
    Proptest: A Property Based Test Pattern Generator for Sequential Circuits Using Test Compaction
    16 years 2 months ago
    Proptest: A Property Based Test Pattern Generator for Sequential Circuits Using Test Compaction
    Download  computing.ece.vt.edu
    Ruifeng Guo, Sudhakar M. Reddy, Irith Pomeranz
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