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EURODAC
1994
IEEE
130views VHDL» more  EURODAC 1994»
15 years 1 months ago
RESIST: a recursive test pattern generation algorithm for path delay faults
This paper presents Resist, a recursive test pattern generation (TPG) algorithm for path delay fault testing of scan-based circuits. In contrast to other approaches, it exploits t...
Karl Fuchs, Michael Pabst, Torsten Rössel
AOSD
2007
ACM
15 years 1 months ago
Generating parallel applications for distributed memory systems using aspects, components, and patterns
Developing and debugging parallel programs particularly for distributed memory architectures is still a difficult task. The most popular approach to developing parallel programs f...
Purushotham V. Bangalore
KDD
2009
ACM
230views Data Mining» more  KDD 2009»
15 years 10 months ago
Analyzing patterns of user content generation in online social networks
Various online social networks (OSNs) have been developed rapidly on the Internet. Researchers have analyzed different properties of such OSNs, mainly focusing on the formation an...
Lei Guo, Enhua Tan, Songqing Chen, Xiaodong Zhang,...
ET
2006
120views more  ET 2006»
14 years 9 months ago
Automatic Test Pattern Generation for Resistive Bridging Faults
An ATPG for resistive bridging faults is proposed that combines the advantages of section-based generation and interval-based simulation. In contrast to the solutions introduced s...
Piet Engelke, Ilia Polian, Michel Renovell, Bernd ...
EMNLP
2008
14 years 11 months ago
Seed and Grow: Augmenting Statistically Generated Summary Sentences using Schematic Word Patterns
We examine the problem of content selection in statistical novel sentence generation. Our approach models the processes performed by professional editors when incorporating materi...
Stephen Wan, Robert Dale, Mark Dras, Cécile...