We consider the problem of built-in test generation for synchronous sequential circuits. The proposed scheme leaves the circuit flip-flops unmodified, and thus allows at-speed ...
Usability-supporting architectural patterns (USAPs) were developed as a way to explicitly connect the needs of architecturally-sensitive usability concerns to the design of softwa...
Bonnie E. John, Len Bass, Elspeth Golden, Pia Stol...
The effect of crosstalk errors is most significant in highperformance circuits, mandating at-speed testing for crosstalk defects. This paper describes a self-test methodology that...
Design patterns have been enthusiastically embraced in the software engineering community as well as in the web community since they capture knowledge about how and when to apply a...
This paper describes a methodology of creating a built-in diagnostic system of a System on Chip and experimental results of the system application on the AT94K FPSLIC with cores d...