— Test Pattern Generation for combinational circuits entails the identification of primary input assignments for detecting each fault in a set of target faults. An extension to ...
Abstract-- Preventing silicon chips from negative, even disastrous thermal hazards has become increasingly challenging these days; considering thermal effects early in the design c...
Wei Huang, Karthik Sankaranarayanan, Kevin Skadron...
This paper presents a methodology to design optimized electronic systems from high abstraction level descriptions. The methodology uses Genetic Programming in addition to high-leve...
A novel methodology for circuit design and automatic layout generation is proposed for a class of mixed-signal circuits in presence of layout parasitics and substrate induced nois...
Paolo Miliozzi, Iasson Vassiliou, Edoardo Charbon,...
This paper investigates retiming and clock skew scheduling for improving the tolerance of synchronous circuits to delay variations. It is shown that when both long and short paths...