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69
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DATE
2003
IEEE
15 years 3 months ago
2003
IEEE
: Stresses are considered an integral part of any modern industrial DRAM test. This paper describes a novel method to optimize stresses for memory testing, using defect injection a...
101
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RSP
2003
IEEE
15 years 3 months ago
2003
IEEE
This paper describes the early analysis and estimation features currently implemented in the Berkeley Emulation Engine (BEE) system. BEE is an integrated rapid prototyping and des...
ISQED
2005
IEEE
15 years 3 months ago
2005
IEEE
As technology continues to scale beyond 100nm, there is a significant increase in performance uncertainty of CMOS logic due to process and environmental variations. Traditional c...
DATE
1999
IEEE
15 years 2 months ago
1999
IEEE
Software programming languages, such as C/C++, have been used as means for specifying hardware for quite a while. Different design methodologies have exploited the advantages of f...
SIGMETRICS
2005
ACM
15 years 3 months ago
2005
ACM
This paper examines the performance of simultaneous multithreading (SMT) for network servers using actual hardware, multiple network server applications, and several workloads. Us...