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94
Voted
VTS
2002
IEEE
108views Hardware» more  VTS 2002»
15 years 3 months ago
On Using Efficient Test Sequences for BIST
High defect coverage requires good coverage of different fault types. In this paper, we present a comprehensive test vector generation technique for BIST, called Random Single Inp...
René David, Patrick Girard, Christian Landr...
86
Voted
SAS
2004
Springer
15 years 4 months ago
Program Generators and the Tools to Make Them
Program generation is among the most promising techniques in the effort to increase the automation of programming tasks. In this paper, we discuss the potential impact and resear...
Yannis Smaragdakis
93
Voted
SMA
2003
ACM
170views Solid Modeling» more  SMA 2003»
15 years 4 months ago
Contour generators of evolving implicit surfaces
The contour generator is an important visibility feature of a smooth object seen under parallel projection. It is the curve on the surface which seperates front-facing regions fro...
Simon Plantinga, Gert Vegter
FCCM
2002
IEEE
174views VLSI» more  FCCM 2002»
15 years 3 months ago
PAM-Blox II: Design and Evaluation of C++ Module Generation for Computing with FPGAs
This paper explores the implications of integrating flexible module generation into a compiler for FPGAs. The objective is to improve the programmabilityof FPGAs, or in other wor...
Oskar Mencer
MTV
2006
IEEE
98views Hardware» more  MTV 2006»
15 years 4 months ago
Directed Micro-architectural Test Generation for an Industrial Processor: A Case Study
Simulation-based validation of the current industrial processors typically use huge number of test programs generated at instruction set architecture (ISA) level. However, archite...
Heon-Mo Koo, Prabhat Mishra, Jayanta Bhadra, Magdy...