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PLDI
2005
ACM
15 years 10 months ago
DART: directed automated random testing
We present a new tool, named DART, for automatically testing software that combines three main techniques: (1) automated extraction of the interface of a program with its external...
Patrice Godefroid, Nils Klarlund, Koushik Sen
SENSYS
2005
ACM
15 years 10 months ago
Design and deployment of industrial sensor networks: experiences from a semiconductor plant and the north sea
Sensing technology is a cornerstone for many industrial applications. Manufacturing plants and engineering facilities, such as shipboard engine rooms, require sensors to ensure pr...
Lakshman Krishnamurthy, Robert Adler, Philip Buona...
SIGMETRICS
2005
ACM
15 years 10 months ago
End-to-end estimation of the available bandwidth variation range
The available bandwidth (avail-bw) of a network path is an important performance metric and its end-to-end estimation has recently received significant attention. Previous work f...
Manish Jain, Constantinos Dovrolis
VEE
2005
ACM
143views Virtualization» more  VEE 2005»
15 years 10 months ago
Virtual machine showdown: stack versus registers
Virtual machines (VMs) are commonly used to distribute programs in an architecture-neutral format, which can easily be interpreted or compiled. A long-running question in the desi...
Yunhe Shi, David Gregg, Andrew Beatty, M. Anton Er...
EMSOFT
2005
Springer
15 years 10 months ago
A sink-n-hoist framework for leakage power reduction
Power leakage constitutes an increasing fraction of the total power consumption in modern semiconductor technologies. Recent research efforts have tried to integrate architecture...
Yi-Ping You, Chung-Wen Huang, Jenq Kuen Lee
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