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GLVLSI
2003
IEEE
180views VLSI» more  GLVLSI 2003»
15 years 3 months ago
3D direct vertical interconnect microprocessors test vehicle
The current trends in high performance integrated circuits are towards faster and more powerful circuits in the giga-hertz range and even further. As the more complex Integrated C...
John Mayega, Okan Erdogan, Paul M. Belemjian, Kuan...
114
Voted
TMC
2012
13 years 19 days ago
Relay-Assisted Transmission with Fairness Constraint for Cellular Networks
Abstract—We consider the problem of relay-assisted transmission for cellular networks. In the considered system, a source node together with n relay nodes are selected in a propo...
Erwu Liu, Qinqing Zhang, Kin K. Leung
ET
2002
122views more  ET 2002»
14 years 10 months ago
Using At-Speed BIST to Test LVDS Serializer/Deserializer Function
LVDS is the acronym for Low-Voltage-DifferentialSignaling and is described in both the ANSI/TIA/EIA644 and IEEE 1596.3 standards. High performance yet Low Power and EMI have made ...
Magnus Eckersand, Fredrik Franzon, Ken Filliter