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DDECS
2007
IEEE
105views Hardware» more  DDECS 2007»
15 years 8 months ago
Layout to Logic Defect Analysis for Hierarchical Test Generation
- As shown by previous studies, shorts between the interconnect wires should be considered as the predominant cause of failures in CMOS circuits. Fault models and tools for targeti...
Maksim Jenihhin, Jaan Raik, Raimund Ubar, Witold A...
ICC
2007
IEEE
140views Communications» more  ICC 2007»
15 years 8 months ago
Performance Analysis of Adaptively-Routed Wormhole-Switched Networks with Finite Buffers
—The use of adaptively-routed wormhole switched k-ary n-cubes has been motivated by the high path diversity provided by the rich topology of this family of interconnection networ...
Nasser Alzeidi, Mohamed Ould-Khaoua, Lewis M. Mack...
SIES
2007
IEEE
15 years 8 months ago
Real-time characteristics of Switched Ethernet for "1553B"-Embedded Applications: Simulation and Analysis
In our previous work [1], Full Duplex Switched Ethernet was put forward as an attractive candidate to replace the MIL-STD 1553B data bus, in next generation "1553B"embedd...
Ahlem Mifdaoui, Fabrice Frances, Christian Fraboul
ASAP
2005
IEEE
104views Hardware» more  ASAP 2005»
15 years 7 months ago
Power Breakdown Analysis for a Heterogeneous NoC Platform Running a Video Application
Users expect future handhelddevices to provide extended multimedia functionality and have long battery life. This type of application imposes heavy constraints on performance and ...
Andy Lambrechts, Praveen Raghavan, Anthony Leroy, ...
ASPDAC
2004
ACM
97views Hardware» more  ASPDAC 2004»
15 years 7 months ago
Complexity analysis and speedup techniques for optimal buffer insertion with minimum cost
As gate delays decrease faster than wire delays for each technology generation, buffer insertion becomes a popular method to reduce the interconnect delay. Several modern buffer in...
Weiping Shi, Zhuo Li, Charles J. Alpert