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VTS
2000
IEEE
114views Hardware» more  VTS 2000»
15 years 11 months ago
Detection of CMOS Defects under Variable Processing Conditions
Transient Signal Analysis is a digital device testing method that is based on the analysis of voltage transients at multiple test points. In this paper, the power supply transient...
Amy Germida, James F. Plusquellic
DAC
2005
ACM
15 years 9 months ago
Smart diagnostics for configurable processor verification
This paper describes a novel technique called Embedded Test-bench Control (ETC), extensively used in the verification of Tensilica’s latest configurable processor. Conventional ...
Sadik Ezer, Scott Johnson
ISCI
2008
137views more  ISCI 2008»
15 years 7 months ago
Stochastic dominance-based rough set model for ordinal classification
In order to discover interesting patterns and dependencies in data, an approach based on rough set theory can be used. In particular, Dominance-based Rough Set Approach (DRSA) has...
Wojciech Kotlowski, Krzysztof Dembczynski, Salvato...

Publication
400views
15 years 2 months ago
Partitioning Histopathological Images: An Integrated Framework for Supervised Color-Texture Segmentation and Cell Splitting
For quantitative analysis of histopathological images, such as the lymphoma grading systems, quantification of features is usually carried out on single cells before categorizing...
Hui Kong, Metin Gurcan, and Kamel Belkacem-Boussai...
CVIU
2007
157views more  CVIU 2007»
15 years 7 months ago
Camera calibration and light source orientation from solar shadows
In this paper, we describe a method for recovering camera parameters from perspective views of daylight shadows in a scene, given only minimal geometric information determined fro...
Xiaochun Cao, Hassan Foroosh