3038 search results - page 481 / 608 » Industrial evolutionary computing |
143
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DAC
2008
ACM
16 years 6 months ago
2008
ACM
An effective technique to save power during scan based test is to switch off unused scan chains. The results obtained with this method strongly depend on the mapping of scan flip-...
155
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DAC
2008
ACM
16 years 6 months ago
2008
ACM
Concurrent interaction of multi-processor systems result in errors which are difficult to find. Traditional simulationbased verification techniques remove the concurrency informat...
149
Voted
DAC
2007
ACM
16 years 6 months ago
2007
ACM
Many STUMPS architectures found in current chip designs allow disabling of individual scan chains for debug and diagnosis. In a recent paper it has been shown that this feature can...
173
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DAC
2007
ACM
16 years 6 months ago
2007
ACM
The complexity and physical distribution of modern active-safety automotive applications requires the use of distributed architectures. These architectures consist of multiple ele...
164
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DAC
1998
ACM
16 years 6 months ago
1998
ACM
A number of techniques and software tools for embedded system design have been recently proposed. However, the current practice in the designer community is heavily based on manua...