Sciweavers

41 search results - page 1 / 9
» Industrial experience with test generation languages for pro...
Sort
View
DAC
2004
ACM
15 years 5 months ago
Industrial experience with test generation languages for processor verification
Michael L. Behm, John M. Ludden, Yossi Lichtenstei...
MTV
2006
IEEE
98views Hardware» more  MTV 2006»
15 years 5 months ago
Directed Micro-architectural Test Generation for an Industrial Processor: A Case Study
Simulation-based validation of the current industrial processors typically use huge number of test programs generated at instruction set architecture (ISA) level. However, archite...
Heon-Mo Koo, Prabhat Mishra, Jayanta Bhadra, Magdy...
DATE
2000
IEEE
132views Hardware» more  DATE 2000»
15 years 3 months ago
Automatic Test Bench Generation for Validation of RT-Level Descriptions: An Industrial Experience
In current microprocessors and systems, an increasingly high silicon portion is derived through automatic synthesis, with designers working exclusively at the RT-level, and design...
Fulvio Corno, Matteo Sonza Reorda, Giovanni Squill...
DAC
2005
ACM
15 years 1 months ago
VLIW: a case study of parallelism verification
Parallelism in processor architecture and design imposes a verification challenge as the exponential growth in the number of execution combinations becomes unwieldy. In this paper...
Allon Adir, Yaron Arbetman, Bella Dubrov, Yossi Li...
CODES
2008
IEEE
15 years 1 months ago
Specification-based compaction of directed tests for functional validation of pipelined processors
Functional validation is a major bottleneck in microprocessor design methodology. Simulation is the widely used method for functional validation using billions of random and biase...
Heon-Mo Koo, Prabhat Mishra