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DATE
2010
IEEE
161views Hardware» more  DATE 2010»
16 years 13 days ago
BISD: Scan-based Built-In self-diagnosis
Abstract—Built-In Self-Test (BIST) is less often applied to random logic than to embedded memories due to the following reasons: Firstly, for a satisfiable fault coverage it may...
Melanie Elm, Hans-Joachim Wunderlich
AADEBUG
1995
Springer
15 years 11 months ago
Software Testability Measurement for Assertion Placement and Fault Localization
Software testability, the tendency for software to reveal its faults during testing, is an important issue for veri cation and quality assurance. Testability measurement can also b...
Jeffrey M. Voas
ECLIPSE
2005
ACM
15 years 9 months ago
IDE Support for test-driven development and automated grading in both Java and C++
Students need to learn testing skills, and using test-driven development on assignments is one way to help students learn. We use a flexible automated grading system called Web-CA...
Anthony Allowatt, Stephen Edwards
ISSRE
2007
IEEE
15 years 9 months ago
Using Machine Learning to Support Debugging with Tarantula
Using a specific machine learning technique, this paper proposes a way to identify suspicious statements during debugging. The technique is based on principles similar to Tarantul...
Lionel C. Briand, Yvan Labiche, Xuetao Liu
WWW
2005
ACM
16 years 8 months ago
A framework for determining necessary query set sizes to evaluate web search effectiveness
We describe a framework of bootstrapped hypothesis testing for estimating the confidence in one web search engine outperforming another over any randomly sampled query set of a gi...
Eric C. Jensen, Steven M. Beitzel, Ophir Frieder, ...