This paper describes a technique which uses the Differential Non Linearity (DNL) test data for fault location and identification of the analog components of a flash ADC. In a flash...
Let S be a p × p random matrix having a Wishart distribution Wp(n, n−1Σ). For testing a general covariance structure Σ = Σ(ξ), we consider a class of test statistics Th = n...
—The increasing attention on global scheduling algorithms for identical multiprocessor platforms produced different, independently developed, schedulability tests. However, the e...
Two main issues need to be covered when dealing with the dependability of component-based systems: quality assurance of reusable software components and quality assurance of the a...
Henry Muccini, Marcio S. Dias, Debra J. Richardson
The testability of basic DSP datapath structures using pseudorandom built-in self-test techniques is examined. The addition of variance mismatched signals is identified as a testi...