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ATS
2005
IEEE
56views Hardware» more  ATS 2005»
15 years 3 months ago
Investigations of Faulty DRAM Behavior Using Electrical Simulation Versus an Analytical Approach
Abstract: Fabrication process improvements and technology scaling results in modifications in the characteristics and in the behavior of manufactured memory chips, which also modi...
Zaid Al-Ars, Said Hamdioui, Jörg E. Vollrath
DATE
2005
IEEE
96views Hardware» more  DATE 2005»
15 years 3 months ago
Framework for Fault Analysis and Test Generation in DRAMs
Abstract: With the increasing complexity of memory behavior, attempts are being made to come up with a methodical approach that employs electrical simulation to tackle the memory t...
Zaid Al-Ars, Said Hamdioui, Georg Mueller, A. J. v...