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134
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DATE
2010
IEEE
161views Hardware» more  DATE 2010»
15 years 5 months ago
BISD: Scan-based Built-In self-diagnosis
Abstract—Built-In Self-Test (BIST) is less often applied to random logic than to embedded memories due to the following reasons: Firstly, for a satisfiable fault coverage it may...
Melanie Elm, Hans-Joachim Wunderlich
130
Voted
DELTA
2010
IEEE
15 years 5 months ago
Notations for Multiphase Pipelines
— FPGAs, (Field-Programmable Gate Arrays) are often used for embedded image processing applications. Parallelism, and in particular pipelining, is the most suitable architecture ...
Christopher T. Johnston, Donald G. Bailey, Paul J....
EICS
2010
ACM
15 years 5 months ago
Self-explanatory user interfaces by model-driven engineering
Modern User Interfaces (UI) must deal with the increasing complexity of applications as well as new features such as the capacity of UIs to be dynamically adapted to the context o...
Alfonso García Frey
108
Voted
APCCAS
2002
IEEE
156views Hardware» more  APCCAS 2002»
15 years 5 months ago
Bit-plane watermarking for zerotree-coded images
In this paper, we develop a robust bit-plane watermarking technique based on zerotree coding. A robust watermark is an imperceptible but indelible code that can be used for owners...
Shih-Hsuan Yang, Hsin-Chang Chen
152
Voted
HASE
2002
IEEE
15 years 5 months ago
An Approach to Specify and Test Component-Based Dependable Software
Components (in-house or pre-fabricated) are increasingly being used to reduce the cost of software development. Given that these components may not have not been developed with de...
Arshad Jhumka, Martin Hiller, Neeraj Suri