6757 search results - page 1225 / 1352 » Knowledge Analysis on Process Models |
TCAD
2008
14 years 10 months ago
2008
Starting at the 65-nm node, stress engineering to improve the performance of transistors has been a major industry focus. An intrinsic stress source--shallow trench isolation (STI)...
CAD
2004
Springer
14 years 9 months ago
2004
Springer
We address the problem of representing and processing 3D objects, described through simplicial meshes, which consist of parts of mixed dimensions, and with a non-manifold topology...
CAD
2000
Springer
14 years 9 months ago
2000
Springer
This paper presents a service marketplace vision for enterprise-wide integrated design modeling. In this environment, expert participants and product development organizations are...
PAMI
2000
14 years 9 months ago
2000
Modern CCD cameras are usually capable of a spatial accuracy greater than 1/50 of the pixel size. However, such accuracy is not easily attained due to various error sources that c...
SIGMETRICS
2002
ACM
14 years 9 months ago
2002
ACM
Probability distributions of response times are important in the design and analysis of transaction processing systems and computercommunication systems. We present a general tech...