6715 search results - page 314 / 1343 » Learning from a Test Set |
152
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IJCNN
2007
IEEE
15 years 11 months ago
2007
IEEE
—Default ARTMAP combines winner-take-all category node activation during training, distributed activation during testing, and a set of default parameter values that define a read...
132
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ISSRE
2000
IEEE
15 years 9 months ago
2000
IEEE
Automated generation of test cases is a prerequisite for fast testing. Whereas the research has addressed the creation of individual test points, test trajectoiy generation has at...
129
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ICML
2005
IEEE
16 years 5 months ago
2005
IEEE
We provide a general framework for learning precise, compact, and fast representations of the Bayesian predictive distribution for a model. This framework is based on minimizing t...
132
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VLSID
1996
IEEE
15 years 9 months ago
1996
IEEE
W epropose a coverage metric and a two-pass test generation method for path delay faults in combinational logic circuits. The coverage is measured for each line with a rising and ...
182
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DCOSS
2007
Springer
15 years 11 months ago
2007
Springer
Abstract. We develop a practical, distributed algorithm to detect events, identify measurement errors, and infer missing readings in ecological applications of wireless sensor netw...