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CONSTRAINTS
2007
112views more  CONSTRAINTS 2007»
14 years 9 months ago
Maxx: Test Pattern Optimisation with Local Search Over an Extended Logic
In the ECAD area, the Test Generation (TG) problem consists in finding an input vector test for some possible diagnosis (a set of faults) of a digital circuit. Such tests may have ...
Francisco Azevedo
VTS
2006
IEEE
116views Hardware» more  VTS 2006»
15 years 3 months ago
Combining Linear and Non-Linear Test Vector Compression Using Correlation-Based Rectangular Encoding
A technique is presented here for improving the compression achieved with any linear decompressor by adding a small non-linear decoder that exploits bit-wise and pattern-wise corr...
Jinkyu Lee, Nur A. Touba
BMCBI
2007
101views more  BMCBI 2007»
14 years 9 months ago
Robust detection and verification of linear relationships to generate metabolic networks using estimates of technical errors
Background: The size and magnitude of the metabolome, the ratio between individual metabolites and the response of metabolic networks is controlled by multiple cellular factors. A...
Frank Kose, Jan Budczies, Matthias Holschneider, O...
STACS
2009
Springer
15 years 4 months ago
Testing Linear-Invariant Non-Linear Properties
Arnab Bhattacharyya, Victor Chen, Madhu Sudan, Nin...
ICCAD
2004
IEEE
101views Hardware» more  ICCAD 2004»
15 years 6 months ago
Frugal linear network-based test decompression for drastic test cost reductions
— In this paper we investigate an effective approach to construct a linear decompression network in the multiple scan chain architecture. A minimal pin architecture, complemented...
Wenjing Rao, Alex Orailoglu, G. Su