654 search results - page 1 / 131 » Linearity Testing in Characteristic Two |
68
Voted
FOCS
1995
IEEE
15 years 1 months ago
1995
IEEE
90
Voted
ISSAC
2009
Springer
15 years 4 months ago
2009
Springer
We address complexity issues for linear differential equations in characteristic p > 0: resolution and computation of the p-curvature. For these tasks, our main focus is on al...
84
Voted
ISSRE
2006
IEEE
15 years 3 months ago
2006
IEEE
The widespread deployment of graphical-user interfaces (GUIs) has increased the overall complexity of testing. A GUI test designer needs to perform the daunting task of adequately...
DGCI
2009
Springer
15 years 24 days ago
2009
Springer
The Minimum Length Polygon (MLP) is an interesting first order approximation of a digital contour. For instance, the convexity of the MLP is characteristic of the digital convexit...
71
Voted
ICIP
2003
IEEE
15 years 11 months ago
2003
IEEE
A critical step in defect detection for semiconductorprocess is to align a test image against a reference. This includes both spatial alignment and grayscale alignment. For the la...